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ORCIDSassan Tabatabaei
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2020 – today
- 2020
[c17]Saleh Heidary Shalmany, Kamran Souri, Uaur Sonmez, Kianoush Souri, Michele D'Urbino, Said Hussaini, Darryl Tauro, Sassan Tabatabaei:
3.7 A 620µW BJT-Based Temperature-to-Digital Converter with 0.65mK Resolution and FoM of 190fJ·K2. ISSCC 2020: 70-72
2010 – 2019
- 2017
- [j9]Meisam Heidarpour Roshan
, Samira Zaliasl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Amanpreet Singh, Sudhakar Pamarti, Nicholas Miller, Joseph C. Doll, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon:
A MEMS-Assisted Temperature Sensor With 20-µK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2. IEEE J. Solid State Circuits 52(1): 185-197 (2017) - 2016
- [c16]Meisam Heidarpour Roshan, Samira Zali Asl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Sudhakar Pamarti, Joseph C. Doll, Nicholas Miller, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon:
11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2. ISSCC 2016: 200-201 - 2013
- [j8]Michael H. Perrott, James C. Salvia, Fred S. Lee, Aaron Partridge, Shouvik Mukherjee, Carl Arft, Jin-Tae Kim, Niveditha Arumugam, Pavan Gupta, Sassan Tabatabaei, Sudhakar Pamarti, Haechang Lee, Fari Assaderaghi:
A Temperature-to-Digital Converter for a MEMS-Based Programmable Oscillator With < ±0.5-ppm Frequency Stability and < 1-ps Integrated Jitter. IEEE J. Solid State Circuits 48(1): 276-291 (2013) - 2012
- [c15]Michael H. Perrott, Jim Salvia, Fred S. Lee, Aaron Partridge, Shouvik Mukherjee, Carl Arft, Jin-Tae Kim, Niveditha Arumugam, Pavan Gupta, Sassan Tabatabaei, Sudhakar Pamarti, Haechang Lee, Fari Assaderaghi:
A temperature-to-digital converter for a MEMS-based programmable oscillator with better than ±0.5ppm frequency stability. ISSCC 2012: 206-208 - 2010
- [j7]Sassan Tabatabaei, Aaron Partridge:
Silicon MEMS Oscillators for High-Speed Digital Systems. IEEE Micro 30(2): 80-89 (2010)
2000 – 2009
- 2009
- [c14]Aaron Partridge, Sassan Tabatabaei:
Silicon MEMS oscillators for high speed digital systems. Hot Chips Symposium 2009: 1-25 - 2007
- [j6]A. K. M. K. Mollah, Roberto Rosales, Sassan Tabatabaei, James Cicalo, André Ivanov:
Design of a Tunable Differential Ring Oscillator With Short Start-Up and Switching Transients. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(12): 2669-2682 (2007) - 2005
- [j5]Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei:
A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. J. Electron. Test. 21(6): 621-630 (2005) - [j4]Andy Kuo, Roberto Rosales, Touraj Farahmand, Sassan Tabatabaei, André Ivanov:
Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects. IEEE Trans. Instrum. Meas. 54(5): 1800-1810 (2005) - [c13]Touraj Farahmand, Sassan Tabatabaei, Freddy Ben-Zeev, André Ivanov:
A DDJ calibration methodology for high-speed test and measurement equipments. ITC 2005: 10 - [c12]Sassan Tabatabaei, Freddy Ben-Zeev, Touraj Farahmand:
Jitter spectrum analysis using continuous time interval analyzer (CTIA). ITC 2005: 10 - 2004
- [j3]Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov:
Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. IEEE Des. Test Comput. 21(4): 302-313 (2004) - [c11]Andy Kuo, Touraj Farahmand, Nelson Ou, André Ivanov, Sassan Tabatabaei:
Jitter Models and Measurement Methods for High-Speed Serial Interconnects. ITC 2004: 1295-1302 - [c10]Sassan Tabatabaei, Michael Lee, Freddy Ben-Zeev:
Jitter Generation and Measurement for Test of Multigbps Serial IO. ITC 2004: 1313-1321 - 2003
- [j2]Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei:
An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Des. Test Comput. 20(1): 60-67 (2003) - [c9]Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, André Ivanov:
Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing. Asian Test Symposium 2003: 348-353 - 2002
- [j1]Sassan Tabatabaei, André Ivanov:
Embedded Timing Analysis: A SoC Infrastructure. IEEE Des. Test Comput. 19(3): 24-36 (2002) - [c8]Sassan Tabatabaei, André Ivanov:
An Embedded Core for Sub-Picosecond Timing Measurements. ITC 2002: 129-137 - [c7]Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song:
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? VTS 2002: 175-176 - [c6]Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei:
Multi-GigaHertz Testing Challenges and Solutions. VTS 2002: 265-268 - 2000
- [c5]Min-Hsing P. Chen, André Ivanov, Sassan Tabatabaei:
Defect Oriented Testing of an ECL/CMOS Level Converter Circuit. LATW 2000: 42-46
1990 – 1999
- 1999
- [c4]Sassan Tabatabaei, André Ivanov:
A built-in current monitor for testing analog circuit blocks. ISCAS (2) 1999: 109-114 - [c3]Sassan Tabatabaei, André Ivanov:
A Current Integrator for BIST of Mixed-Signal ICs. VTS 1999: 311-318 - 1998
- [c2]Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell:
Testing for Floating Gates Defects in CMOS Circuits. Asian Test Symposium 1998: 228-236 - 1997
- [c1]Maneesha Dalmia, André Ivanov, Sassan Tabatabaei:
Power supply current monitoring techniques for testing PLLs. Asian Test Symposium 1997: 366-371
Coauthor Index
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