"A retention-aware test power model for embedded SRAM."

Baosheng Wang et al. (2005)

> Home

Details and statistics

DOI: 10.1145/1120725.1120935

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  authority control:
- export record
  dblp key:
  - conf/aspdac/WangYWI05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aspdac/WangYWI05
Baosheng Wang, Josh Yang, Yuejian Wu, André Ivanov:
A retention-aware test power model for embedded SRAM. ASP-DAC 2005: 1180-1183

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.