"New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault ..."

Debesh Kumar Das, Satoshi Ohtake, Hideo Fujiwara (1999)

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DOI: 10.1109/ATS.1999.810761

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Debesh Kumar Das, Satoshi Ohtake, Hideo Fujiwara:
New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency. Asian Test Symposium 1999: 263-268

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