"Test Efficiency Analysis and Improvement of SOC Test Platforms."

Tong-Yu Hsieh, Kuen-Jong Lee, Jian-Jhih You (2007)

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DOI: 10.1109/ATS.2007.67

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Tong-Yu Hsieh, Kuen-Jong Lee, Jian-Jhih You:
Test Efficiency Analysis and Improvement of SOC Test Platforms. ATS 2007: 463-466

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