"Easily Testable Data Path Allocation Using Input/Output Registers."

Li-Ren Huang et al. (1996)

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DOI: 10.1109/ATS.1996.555151

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Li-Ren Huang, Jing-Yang Jou, Sy-Yen Kuo, Wen-Bin Liao:
Easily Testable Data Path Allocation Using Input/Output Registers. Asian Test Symposium 1996: 142-

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