"An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern ..."

Fukashi Morishita, Masanori Otsuka, Wataru Saito (2020)

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DOI: 10.1109/ATS49688.2020.9301531

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Fukashi Morishita, Masanori Otsuka, Wataru Saito:
An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor. ATS 2020: 1-6

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