"Multi-cycle Test with Partial Observation on Scan-Based BIST Structure."

Yasuo Sato et al. (2011)

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DOI: 10.1109/ATS.2011.34

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yasuo Sato, Hisato Yamaguchi, Makoto Matsuzono, Seiji Kajihara:
Multi-cycle Test with Partial Observation on Scan-Based BIST Structure. Asian Test Symposium 2011: 54-59

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