"Robust Self Concurrent Test of Linear Digital Systems."

Emmanuel Simeu, Ahmad Abdelhay, Mohammad A. Naal (2001)

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DOI: 10.1109/ATS.2001.990298

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Emmanuel Simeu, Ahmad Abdelhay, Mohammad A. Naal:
Robust Self Concurrent Test of Linear Digital Systems. Asian Test Symposium 2001: 293-298

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