"Modeling of intra-die process variations for accurate analysis and ..."

Sarvesh Bhardwaj et al. (2006)

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DOI: 10.1145/1146909.1147109

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Sarvesh Bhardwaj, Sarma B. K. Vrudhula, Praveen Ghanta, Yu Cao:
Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits. DAC 2006: 791-796

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