"Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits."

Salvador Mir et al. (1996)

> Home

Details and statistics

DOI: 10.1109/EDTC.1996.494157

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

- view
  authority control:
- export record
  dblp key:
  - conf/date/MirCLK96
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/MirCLK96
Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik:
Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. ED&TC 1996: 254-258

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.