"A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal ..."

Luís Rolíndez et al. (2004)

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DOI: 10.1109/DATE.2004.1268939

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Luís Rolíndez, Salvador Mir, Guillaume Prenat, Ahcène Bounceur:
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns. DATE 2004: 706-707

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