"Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates."

Kristian Granhaug, Snorre Aunet (2006)

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DOI: 10.1109/DFT.2006.35

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/GranhaugA06
Kristian Granhaug, Snorre Aunet:
Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. DFT 2006: 20-28

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