"Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?"

Marcelo Lubaszewski (2009)

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DOI: 10.1109/DFT.2009.62

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Marcelo Lubaszewski:
Can Functional Test Achieve Low-cost Full Coverage of NoC Faults? DFT 2009: 224-224

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