"Effects of single vacancy defects on 1/f noise in grapbene/b-BN FETs."

Ting Wu et al. (2018)

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DOI: 10.1109/DRC.2018.8442196

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-21

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Ting Wu, Abdullah Alharbi, Takashi Taniguchi, Kenji Watanabe, Davood Shahrjerdi:
Effects of single vacancy defects on 1/f noise in grapbene/b-BN FETs. DRC 2018: 1-2

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