"A method for trading off test time, area and fault coverage in datapath ..."

David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre (2000)

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DOI: 10.1109/ETW.2000.873790

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre:
A method for trading off test time, area and fault coverage in datapath BIST synthesis. ETW 2000: 133-139

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