"Re-using BIST for circuit aging monitoring."

Farshad Firouzi et al. (2015)

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DOI: 10.1109/ETS.2015.7138768

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  - conf/ets/FirouziYVKCT15
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  - https://dblp.org/rec/conf/ets/FirouziYVKCT15
Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Re-using BIST for circuit aging monitoring. ETS 2015: 1-2

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