"Device aging: A reliability and security concern."

Daniel Kraak et al. (2018)

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DOI: 10.1109/ETS.2018.8400702

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-06

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Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi:
Device aging: A reliability and security concern. ETS 2018: 1-10

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