"On-chip temperature and voltage measurement for field testing."

Yukiya Miura et al. (2012)

> Home

Details and statistics

DOI: 10.1109/ETS.2012.6233035

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ets/MiuraSMK12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/MiuraSMK12
Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara:
On-chip temperature and voltage measurement for field testing. ETS 2012: 1

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.