"Modeling gate oxide short defects in CMOS minimum transistors."

Michel Renovell et al. (2002)

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DOI: 10.1109/ETW.2002.1029634

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand:
Modeling gate oxide short defects in CMOS minimum transistors. ETW 2002: 15-20

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