"Automated image analysis for electron microscopy specimen assessment."

Nicolas Coudray et al. (2007)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2021-08-09

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  dblp key:
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  - https://dblp.org/rec/conf/eusipco/CoudrayBKU07
Nicolas Coudray, Jean-Luc Buessler, Hubert Kihl, Jean-Philippe Urban:
Automated image analysis for electron microscopy specimen assessment. EUSIPCO 2007: 120-124

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