"Second Competition on Software Testing: Test-Comp 2020."

Dirk Beyer (2020)

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DOI: 10.1007/978-3-030-45234-6_25

access: open

type: Conference or Workshop Paper

metadata version: 2021-05-14

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  dblp key:
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Dirk Beyer:
Second Competition on Software Testing: Test-Comp 2020. FASE 2020: 505-519

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