"Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit ..."

Nicolas Moro et al. (2013)

> Home

Details and statistics

DOI: 10.1109/FDTC.2013.9

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/fdtc/MoroDHRE13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/fdtc/MoroDHRE13
Nicolas Moro, Amine Dehbaoui, Karine Heydemann, Bruno Robisson, Emmanuelle Encrenaz:
Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit Microcontroller. FDTC 2013: 77-88

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.