"Combining static and dynamic defect-tolerance techniques for nanoscale ..."

Susmit Biswas et al. (2007)

> Home

Details and statistics

DOI: 10.1109/ICCAD.2007.4397359

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/iccad/BiswasWMKC07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccad/BiswasWMKC07
Susmit Biswas, Gang Wang, Tzvetan S. Metodi, Ryan Kastner, Frederic T. Chong:
Combining static and dynamic defect-tolerance techniques for nanoscale memory systems. ICCAD 2007: 773-778

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.