"Dynamic test scheduling for analog circuits for improved test quality."

Ender Yilmaz, Sule Ozev (2008)

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DOI: 10.1109/ICCD.2008.4751866

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ender Yilmaz, Sule Ozev:
Dynamic test scheduling for analog circuits for improved test quality. ICCD 2008: 227-233

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