"Influence of Built-In Self Test on the Performance of Fault Tolerant VLSI ..."

David L. Landis, Daniel C. Muha, William A. Check (1987)

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type: Conference or Workshop Paper

metadata version: 2014-07-28

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David L. Landis, Daniel C. Muha, William A. Check:
Influence of Built-In Self Test on the Performance of Fault Tolerant VLSI Multiprocessors. ICPP 1987: 114-116

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