"Aging test strategy and adaptive test scheduling for SoC failure prediction."

Hyunbean Yi et al. (2010)

> Home

Details and statistics

DOI: 10.1109/IOLTS.2010.5560239

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iolts/YiYISKF10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iolts/YiYISKF10
Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara:
Aging test strategy and adaptive test scheduling for SoC failure prediction. IOLTS 2010: 21-26

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.