"ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. ..."

Eliana Acurio et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405163

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Eliana Acurio, Lionel Trojman, Brice De Jaeger, Benoit Bakeroot, Stefaan Decoutere:
ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric. IRPS 2021: 1-6

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