"Testability of Generalized Multiple-Valued Reed-Muller Circuits."

Elena Dubrova, Jon C. Muzio (1996)

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DOI: 10.1109/ISMVL.1996.508336

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Elena Dubrova, Jon C. Muzio:
Testability of Generalized Multiple-Valued Reed-Muller Circuits. ISMVL 1996: 56-61

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