"Adapting an industrial memory BIST solution for testing CAMs."

Jais Abraham et al. (2017)

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DOI: 10.1109/ITC-ASIA.2017.8097123

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-13

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Jais Abraham, Uttam Garg, Glenn Colón-Bonet, Ramesh Sharma, Chennian Di, Benoit Nadeau-Dostie, Etienne Racine, Martin Keim:
Adapting an industrial memory BIST solution for testing CAMs. ITC-Asia 2017: 112-117

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