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"Industrial Experience with Adoption of EDT for Low-Cost Test without ..."
Frank Poehl et al. (2003)
- Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski:
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC 2003: 1211-1220
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