"EEPROM Memory: Threshold Voltage Built In Self Diagnosis."

Jean-Michel Portal, Hassen Aziza, Didier Née (2003)

> Home

Details and statistics

DOI: 10.1109/TEST.2003.1270821

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/PortalAN03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/PortalAN03
Jean-Michel Portal, Hassen Aziza, Didier Née:
EEPROM Memory: Threshold Voltage Built In Self Diagnosis. ITC 2003: 23-28

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.