"A process tolerant semi-self impedance calibration method for LPDDR4 ..."

Ho Joon Lee, Yong-Bin Kim (2015)

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DOI: 10.1109/MWSCAS.2015.7282070

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-26

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Ho Joon Lee, Yong-Bin Kim:
A process tolerant semi-self impedance calibration method for LPDDR4 memory controller. MWSCAS 2015: 1-4

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