"A lifespan-aware reliability scheme for RAID-based flash storage."

Sehwan Lee et al. (2011)

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DOI: 10.1145/1982185.1982266

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Sehwan Lee, Bitna Lee, Kern Koh, Hyokyung Bahn:
A lifespan-aware reliability scheme for RAID-based flash storage. SAC 2011: 374-379

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