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"Fault Models and Compact Test Vectors for MOS OpAmp circuits."
José Vicente Calvano et al. (2000)
- José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho:
Fault Models and Compact Test Vectors for MOS OpAmp circuits. SBCCI 2000: 289-294
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