"Deep learning-based defective product classification system for smart factory."

Huy Toan Nguyen et al. (2020)

> Home

Details and statistics

DOI: 10.1145/3426020.3426039

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/sma2/NguyenSYKKK20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sma2/NguyenSYKKK20
Huy Toan Nguyen, Nu-ri Shin, Gwanghyun Yu, Gyeong-Ju Kwon, Woo-Young Kwak, Jin-Young Kim:
Deep learning-based defective product classification system for smart factory. SMA 2020: 80-85

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.