"Diagnostic Test Pattern Generation for Sequential Circuits."

Ismed Hartanto et al. (1997)

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DOI: 10.1109/VTEST.1997.600264

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs:
Diagnostic Test Pattern Generation for Sequential Circuits. VTS 1997: 196-202

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