"Simulation-Based Test Algorithm Generation for Random Access Memories."

Chi-Feng Wu et al. (2000)

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DOI: 10.1109/VTEST.2000.843857

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Cheng-Wen Wu:
Simulation-Based Test Algorithm Generation for Random Access Memories. VTS 2000: 291-296

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