"From Sample Poverty to Rich Feature Learning: A New Metric Learning Method ..."

Lei Zhang et al. (2024)

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DOI: 10.1109/ACCESS.2024.3444483

access: open

type: Journal Article

metadata version: 2025-01-19

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Lei Zhang, Yiting Lin, Xinyu Yang, Tingting Chen, Xiyuan Cheng, Wenbin Cheng:
From Sample Poverty to Rich Feature Learning: A New Metric Learning Method for Few-Shot Classification. IEEE Access 12: 124990-125002 (2024)

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