"ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal ..."

Anthony Coyette et al. (2018)

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DOI: 10.1109/MDAT.2018.2799800

access: closed

type: Journal Article

metadata version: 2020-03-13

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Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren:
ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. IEEE Des. Test 35(3): 24-30 (2018)

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