"Fast Test Pattern Generation for Sequential Circuits Using Decision ..."

Jaan Raik, Raimund Ubar (2000)

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DOI: 10.1023/A:1008335130158

access: closed

type: Journal Article

metadata version: 2020-10-26

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Jaan Raik, Raimund Ubar:
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations. J. Electron. Test. 16(3): 213-226 (2000)

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