"On the fault tolerance of a clustered single-electron neural network for ..."

Takahide Oya et al. (2005)

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DOI: 10.1587/ELEX.2.76

access: open

type: Journal Article

metadata version: 2024-05-07

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  - journals/ieiceee/OyaSALA05
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  - https://dblp.org/rec/journals/ieiceee/OyaSALA05
Takahide Oya, Alexandre Schmid, Tetsuya Asai, Yusuf Leblebici, Yoshihito Amemiya:
On the fault tolerance of a clustered single-electron neural network for differential enhancement. IEICE Electron. Express 2(3): 76-80 (2005)

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