"Edge Intelligence for Smart EL Images Defects Detection of PV Plants in ..."

Wuqin Tang et al. (2023)

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DOI: 10.1109/JIOT.2022.3150298

access: closed

type: Journal Article

metadata version: 2023-10-30

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Wuqin Tang, Qiang Yang, Xiaochen Hu, Wenjun Yan:
Edge Intelligence for Smart EL Images Defects Detection of PV Plants in the IoT-Based Inspection System. IEEE Internet Things J. 10(4): 3047-3056 (2023)

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