"An improved semi-supervised learning method for software defect prediction."

Ying Ma et al. (2014)

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DOI: 10.3233/IFS-141220

access: closed

type: Journal Article

metadata version: 2020-04-25

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  - https://dblp.org/rec/journals/jifs/MaPZYL14
Ying Ma, Weiwei Pan, Shunzhi Zhu, Huayi Yin, Jian Luo:
An improved semi-supervised learning method for software defect prediction. J. Intell. Fuzzy Syst. 27(5): 2473-2480 (2014)

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