"CMOS layout generation for improved testability."

Olaf Stern, Heinrich Theodor Vierhaus (1990)

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DOI: 10.1016/0165-6074(90)90291-G

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type: Journal Article

metadata version: 2022-08-12

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Olaf Stern, Heinrich Theodor Vierhaus:
CMOS layout generation for improved testability. Microprocessing and Microprogramming 30(1-5): 509-512 (1990)

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