"CMOS Smart Sensor for Monitoring the Quality of Perishables."

Ken Ueno et al. (2007)

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DOI: 10.1109/JSSC.2007.891676

access: closed

type: Journal Article

metadata version: 2024-05-07

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Ken Ueno, Tetsuya Hirose, Tetsuya Asai, Yoshihito Amemiya:
CMOS Smart Sensor for Monitoring the Quality of Perishables. IEEE J. Solid State Circuits 42(4): 798-803 (2007)

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