"Column-matching based mixed-mode test pattern generator design technique ..."

Petr Fiser, Hana Kubátová (2008)

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DOI: 10.1016/J.MICPRO.2008.03.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Petr Fiser, Hana Kubátová:
Column-matching based mixed-mode test pattern generator design technique for BIST. Microprocess. Microsystems 32(5-6): 340-350 (2008)

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