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"Improving SiC lateral DMOSFET reliability under high field stress."
Tesfaye Ayalew et al. (2003)
- Tesfaye Ayalew, Andreas Gehring, Jong Mun Park, Tibor Grasser, Siegfried Selberherr:
Improving SiC lateral DMOSFET reliability under high field stress. Microelectron. Reliab. 43(9-11): 1889-1894 (2003)
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