"Modeling and simulation of an active restoring mechanism for high ..."

Thomas Kuenzig, Gabriele Schrag, Jacopo Iannacci (2012)

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DOI: 10.1016/J.MICROREL.2012.06.137

access: closed

type: Journal Article

metadata version: 2022-02-04

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Thomas Kuenzig, Gabriele Schrag, Jacopo Iannacci:
Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology. Microelectron. Reliab. 52(9-10): 2235-2239 (2012)

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