"EBSD measurements of elastic strain fields in a GaN/sapphire structure."

J. F. Luo et al. (2006)

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DOI: 10.1016/J.MICROREL.2005.05.012

access: closed

type: Journal Article

metadata version: 2020-12-22

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J. F. Luo, Yuan Ji, T. X. Zhong, Y. Q. Zhang, J. Z. Wang, J. P. Liu, N. H. Niu, J. Han, X. Guo, G. D. Shen:
EBSD measurements of elastic strain fields in a GaN/sapphire structure. Microelectron. Reliab. 46(1): 178-182 (2006)

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