"Microscopic scale characterization and modeling of transistor degradation ..."

Yoann Mamy Randriamihaja et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.04.005

access: closed

type: Journal Article

metadata version: 2023-09-30

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Yoann Mamy Randriamihaja, Vincent Huard, Xavier Federspiel, Alban Zaka, Pierpaolo Palestri, Denis Rideau, David Roy, Alain Bravaix:
Microscopic scale characterization and modeling of transistor degradation under HC stress. Microelectron. Reliab. 52(11): 2513-2520 (2012)

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